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Description :
1. Wafer Diameter: (125 x 125)+/-0,4mm
2. Dimensions Tolerance: +/-0,4mm
3. Thickness of wafer, measured in the center of wafer: 190+/- 10μm, ≥185 μm
4. TTV: not more than 25 μm
5. Saw mark: ≤15 μm, invisible by eyes
6. Camber: ≤30 μm
7. Arc width departure(Big and small angle): ≤2mm in 45°
8. Surface Quality: No crack, no obvious saw mark, without obvious tactility, no pit, no V type gap, no hole, no glue left, surface cleaned, no abnormal spot, no stain.
9. Notch: not allowed
10. Tiny luminance Edge: Width ≤1/3 of wafer thickness; Length≤1/2 of wafer dimension
11. Edge defect: Edge defect width ≤0.2mm; extension less than 0.5mm; with total quantity ≤2, distance≥30mm1000000China1
Certification :
Origine du produit :
INFORMATION TARIFAIRE :
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